Abstract: Safety is always the first concern for public when it comes to airplanes. Thanks to the efforts made by all related stakeholders, taking an airplane now is significantly much safer than it ...
Technology assessment of Si and III-V FinFETs and III-V tunnel FETs from soft error rate perspective
Abstract: Sea-level soft error performance has been investigated for Si FinFET, III-V FinFET and III-V Heterojunction Tunnel FET in this paper. Transient error ...
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