Hidden semiconductor defects often pass inspection but fail later in operation. Learn how latent defects form, evade ...

In the upcoming NFPA 70E 2024 Edition, the inclusion of the phrase “at each point of work” and the relationship to absence of voltage testing has prompted questions regarding the use of Permanent ...

Are your environmental test results exposing true device weaknesses, or just reflecting extreme stress conditions?

As silicon photonics costs come down, the technology is being worked into new applications, from connectivity to AI. But full commercial production requires testing those photonic circuits before ...

Yield loss is increasingly driven by molecular variability in thin films, interfaces, and contamination rather than visible defects. Reliability issues often appear first as parametric drift or margin ...

Designers often develop a single board that can be configured using different firmware for multiple end-user applications. This approach allows companies to reuse critical intellectual property and ...

Electrical safety testing has been around for almost a century, and safety agencies have been testing and certifying products for almost as long. Electrical and electronic products have changed ...

Industry standards group AIM Global has released the latest version of its standard for the testing of non-implantable wireless medical devices, to help users and manufacturers better determine if ...